The following are typical applications
Various samples can be handled depending on the combination of equipment and tools.
Please feel free to contact us for an explanation of optimal combinations and usage. Click here to contact us.
Can be handled with a tungsten probe or vacuum suction set with a diameter smaller than the object. Further accurate delivery is possible with a combination of tools and manipulators. Tungsten probes with diameters as small as 0.5µm are available.
Sample preparation for FT-IR analysis, collecting only minute foreign particles, and transferring them to a window plate.
Sample preparation for SEM analysis, collecting only minute particles and delivering them to the carbon tape.
Semi-embedded foreign bodies can also be headed out with a carbide probe or carbide scraper. Depending on the situation, it is also possible to collect and deliver it as it is.
Heading out of foreign matter semi-embedded in resin, such as film, etc.
Heading and sampling of foreign matter in tablets
Buried foreign matter can be cut and sectioned with a carbide scraper. Combined with manipulators, accurate control of depth direction is possible.
Cross-sectioning out foreign matter embedded in resin such as film.
After collecting minute foreign matter with a tungsten probe, etc., it is possible up to delivery with a scraper or vacuum adsorption set.
Collection of microscopic foreign particles on the substrate and delivery to the window plate for FT-IR
In addition to microscopic foreign matter, ink and other substances can also be collected and delivered using tungsten or carbide probes.
Targeted inks for paintings can also be collected and delivered.
By using a glass probe or vacuum adsorption set, it is possible to pass thin sections prepared by FIB for TEM analysis up to the mesh. The motorized manipulator can memorize the Z-axis position in advance, making it easy to pass and move on to the next object.
Thin sections prepared by FIB and delivered to TEM mesh.
It is possible to mark (kegaku) around the object with a carbide probe, etc. Accurate marking is possible when combined with manipulators.
Marking around the object before SEM observation
Marking around the object to be prepared in advance when thin sections are prepared by FIB.
It can also be used as a manual prober by contacting the tungsten probe between two points. Since the same posture must be maintained, manipulators are required.
2-point contact to electrode pad
Contact between two points to a micro-insulation area