We introduce typical applications as follows. By selecting sampling equipment and micro tools, it is possible to handle a variety of samples. Depending on the situation, microtools alone may be sufficient. Please feel free to contact us and we will explain the combination and usage that is suitable for your sample and situation. Contact Us
Can be handled using a tungsten probe with a diameter smaller than the target object or a vacuum suction set. A combination of tools and manipulators allows for even more accurate delivery. We offer tungsten probes with a minimum diameter of 0.5 µm.
・Collect only minute foreign matter during sample preparation for FT-IR analysis and deliver it to the window plate.
・Collect only minute foreign matter during sample preparation for SEM analysis and transfer to carbon tape
Even semi-buried foreign objects can be located using a carbide probe or scraper. Depending on the situation, it is also possible to collect and deliver as is.
・Cue foreign matter partially buried in resin such as film
・Searching and collecting foreign substances in tablets
It is possible to cut buried foreign matter with a carbide scraper and find the cross section. Accurate control in the depth direction is possible when combined with a manipulator.
- Cross section of foreign matter embedded in resin such as film.
After collecting minute foreign matter with a tungsten probe, etc., it is possible to deliver it using a scraper or vacuum suction set.
・Collecting minute foreign matter on the board and delivering it to the FT-IR window plate
Ink, etc. other than minute foreign matter can also be collected and delivered using a tungsten probe or carbide probe.
・It is also possible to collect and deliver ink for paintings.
By using a glass probe or vacuum suction set, it is possible to transfer thin sections prepared with FIB for TEM analysis to the mesh. If you memorize the Z-axis position in advance with the electric manipulator, it will be easier to transfer and move on to the next object.
・Transfer of the thin section prepared by FIB to the TEM mesh.
It is possible to mark (injure) the area around the object with a carbide probe, etc. Accurate marking is possible when combined with a manipulator.
・Marking around the object before SEM observation
・When preparing a thin section with FIB, mark the area around it in advance.
It can also be used as a manual prober by contacting the tungsten probe between two points. A manipulator is essential as it is necessary to maintain the same posture.
・Two-point contact to electrode pad
・Two-point contact to micro-insulated areas
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